GETS-1000 Technical Overview
Newest Addition - GETS-1000C-MW
One of the challenges to maintaining older weapon systems is the insufficiency of depot test equipment.  The General-Purpose Electronic Test Station (GETS)-1000 Family of Automated Test Equipment (ATE) has evolved by taking full advantage of current technology while maintaining the capability to execute all previously developed test programs.

Pictured below are some of the GETS-1000 family

GETS-1000B2M
GETS-1000B1M
GETS-1000B1
GETS-1000D1
 

Mobile GETS

The GETS-1000 family is designed for depot-level testing of multiple weapon systems and provides users with a broad spectrum of capabilities that can ultimately reduce the proliferation of and reliance upon system-unique test equipment. The GETS-1000 family of Automatic Test Equipment (ATE) is based on the recognition that ATE represents a significant portion of the support costs associated with performing the depot maintenance of a weapon system.


The GETS-1000 family is designed to reduce the cost of ownership by providing the following capabilities to:


Support multiple weapon systems

The GETS-1000B1 (Pictured Above) currently supports PATRIOT, HAWK (Including PIP III), and Electronic Warfare Systems, Future Efforts will include Chaparral, the AN/TPS-59 radar, and other weapon systems and subsystems.


Replace multiple factory and depot test stations

The GETS-1000 replaced the PATRIOT PAT-265E Microwave Test Station, PAT-2215 High-Speed Digital Test Station, and PAT-2203/2204 Power Supply Test Stations. In addition, the M920 VXI Digital Test Instrument (DTI) is equivalent to the Teradyne L200/L300 tester series, while adding greater mixed signal capacity.


Use Commercial off-the-shelf instrumentation

This equipment uses and open architecture concept that supports both VXI and monolithic instrumentation from multiple vendors to test a broad range of devices selected for capability, mean time between failure (MTBF), supportability, warranty, and cost. Instruments are selected to ensure that they can be repaired and calibrated in the host country using available commerical resources or in-house capability.


Use industry-standard test software

In addition to ATLAS, the GETS-1000B1/B1M can be programmed using National Instruments LabWindows or LabView, the HP Virtul Engineering enviroment, and Teradyne "L" series test language. This capability reduces the cost of test program set(TPS) development and enables effective re-hosting of existing test programs and simulations.


Operate its own Program Development Station (PDS)

Should customers wish it, a PDS that can be used to develop system-unique TPS's for devices such as unique communications equipment can be obtained. Using the PDS eliminates the need for special-purpose test stations, as well as enabling devices being tested on aging ATE to be rehosted on the GETS-1000. This capability precludes the requirement to replace the outdated or weapon-system-unique test station. As weapon systems stay in the field longer, rehosting becomes a cost-effective method of maintaining support capability.


Support remote diagnostics and TPS development

The instrument bus uses National Instrument "GPIB-ENET" adapters that convert TCP/IP packets to IEEE-488 commands. This feature enables a remote user to program the station either to perform diagnostic testing or TPS development, reducing the need to provide expensive instruments to the test engineer who is geographically separated from the test station.


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 GETS-1000 Technical Features Page


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